Dynamic leakage current compensation in ferroelectric thin-film capacitor structures
2005; American Institute of Physics; Volume: 86; Issue: 14 Linguagem: Inglês
10.1063/1.1897425
ISSN1520-8842
AutoresR. Meyer, Rainer Waser, K. Prume, Torsten Schmitz, S. Tiedke,
Tópico(s)Acoustic Wave Resonator Technologies
ResumoWe report on a measurement procedure to separate ferroelectric switching current and dielectric displacement current from the leakage current in leaky ferroelectric thin-film capacitor structures. The ac current response is determined for two adjacent frequencies. Taking advantage of the different frequency dependencies of the ferroelectric switching current, dielectric displacement current and ohmic current, the hysteresis loop is calculated without performing a static leakage current measurement, which causes a high dc field stress to the sample. The applicability of the proposed measurement procedure is demonstrated on a Pt∕Pb(Zr,Ti)O3∕IrO2 ferroelectric capacitor revealing a high leakage current.
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