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A study of the 160 MeV Ni 7+ swift heavy ion irradiation effect of defect creation and shifting of the phonon modes on Mn x Zn 1–x O thin films

2017; Royal Society of Chemistry; Volume: 7; Issue: 55 Linguagem: Inglês

10.1039/c7ra01809f

2046-2069

H. A. Khawal, B. N. Dole,

Thin-Film Transistor Technologies

The energy loss to vacancy production shows that the number of vacancies depend on the displacement energy assigned to each target atom element is shown separately.