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Artigo Revisado por pares

I.C. Kizilyalli, G. C. Abeln, Zhelin Chen, J. Lee, Gary R. Weber, Bernhard Kotzias, S. Chetlur, Joseph W. Lyding, K. Hess,

... experimental findings critical for process integration of deuterium post-metal anneals to improve channel hot carrier reliability in ... instead of hydrogen is introduced via an optimized post-metal anneal process to achieve a 50-100 fold ... deuterium anneal are still observed even if the post-metal anneal is followed by the final SiN cap ... passivation process. It is concluded that the deuterium post-metal anneal process is suitable for manufacturing high performance ...

Tópico(s): Silicon and Solar Cell Technologies

1998 - Institute of Electrical and Electronics Engineers | IEEE Electron Device Letters

Artigo Revisado por pares

Somenath Chatterjee, Yue Kuo, J.X. Lu,

... thicknesses, e.g., 2.5–10 nm, and post-metal annealing (PMA) temperatures, e.g., 600 °C to ... electrode was dependent on the material and the post-metal annealing (PMA) temperature. The scanning transmission electron microscopy ... metal nitride gate electrode material but also the post-metal annealing condition as well as the film thickness. ...

Tópico(s): Advancements in Semiconductor Devices and Circuit Design

2007 - Elsevier BV | Microelectronic Engineering

Artigo Acesso aberto Revisado por pares

Pei-Chuen Jiang, Jen‐Sue Chen,

... properties of metal oxide semiconductor (MOS) capacitors upon post-metal annealing in or ambient at 400-600°C ... the MOS capacitors are similar before and after post-metal annealing. C-V hysteresis measurements showed that charges ...

Tópico(s): Advancements in Semiconductor Devices and Circuit Design

2004 - Institute of Physics | Journal of The Electrochemical Society

Artigo Acesso aberto Revisado por pares

Tarun Mudgal, Nathaniel Walsh, Robert G. Manley, Karl D. Hirschman,

... electrodes. Annealing was performed either pre-metal or post-metal deposition, in various gas ambient conditions including air, ... on Mo-contact and Al-contact devices. A post-metal anneal for Mo-contact devices resulted in higher ... for controlling the electronic properties of IGZO. A post-metal anneal at 400°C in N2 followed by ...

Tópico(s): Silicon and Solar Cell Technologies

2014 - Institute of Physics | ECS Journal of Solid State Science and Technology

Artigo

Tarun Mudgal, Nathaniel Walsh, Robert G. Manley, Karl D. Hirschman,

... electrodes. Annealing was performed either pre-metal or post-metal deposition, in various gas ambients including air, oxygen, ... on Mo-contact and Al-contact devices. A post-metal anneal for Mo-contact devices resulted in higher ... formation of an AlO x interface layer. A post-metal anneal at 400 °C in N 2 followed ...

Tópico(s): Nanowire Synthesis and Applications

2014 - Institute of Physics | ECS Transactions

Artigo Revisado por pares

Eun-Ki Hong, Won-Ju Cho,

... based MOSFETs. The MWI technique is used for post-metal annealing (PMA) in air ambient, and compared with ... time, low temperature, vacuum-free alternative to conventional post-metal annealing methods, but it also allows much lower ...

Tópico(s): Semiconductor materials and interfaces

2017 - Elsevier BV | Microelectronics Reliability

Artigo Revisado por pares

Jiabo Chen, Zhaoke Bian, Zhihong liu, Dan Zhu, Xiaoling Duan, Yinhe Wu, Yanqing Jia, Jing Ning, Jincheng Zhang, Yue Hao,

... Mo/Au Schottky contacts on n-GaN with post metal annealing at 300, 500 and 700 °C have ... with as-deposited Mo/Au, the one with post metal annealing at 300 °C, the one annealed 500 ° ... current and the breakdown voltage were achieved after post metal annealing at 500 °C. Transmission Electron Microscopy (TEM) ...

Tópico(s): GaN-based semiconductor devices and materials

2020 - Elsevier BV | Journal of Alloys and Compounds

Artigo Revisado por pares

Viktor Zekeriya, T-P. Ma,

... Si structure change systematically with time lapse between post-metal-anneal treatment and x-ray irradiation, and strong ...

Tópico(s): Semiconductor materials and interfaces

1984 - American Institute of Physics | Applied Physics Letters

Artigo Revisado por pares

S.C. Vitkavage, E. A. Irene, Hisham Z. Massoud,

... 1100 °C range, with and without hydrogen-containing post-metal anneals, and for processing within and without a ... in non-cleanroom processing and the lack of post-metal annealing can either obscure or enhance some trends. ...

Tópico(s): Semiconductor materials and interfaces

1990 - American Institute of Physics | Journal of Applied Physics

Artigo Revisado por pares

Jong‐Il Kim, Kang Sup Shin, Kye Hyun Baek, Dal Jin Lee, Kil Ho Kim, Chung Ho Hwang, Dae Hoon Lee,

... species on charging induced tungsten plug corrosion during post metal etch process have been investigated. It was found ...

Tópico(s): Hydrogen embrittlement and corrosion behaviors in metals

2002 - Institute of Physics | Japanese Journal of Applied Physics

Artigo Revisado por pares

Pang-Shiu Chen, Heng-Yuan Lee, Yu-Sheng Chen, Frederick Chen, Ming‐Jinn Tsai,

... electrodes are studied in this work. After appropriate post metal annealing (PMA), the reactive metal layer with high ...

Tópico(s): Electronic and Structural Properties of Oxides

2010 - Institute of Physics | Japanese Journal of Applied Physics

Artigo Revisado por pares

Somenath Chatterjee, Yue Kuo, J.X. Lu, J.-Y. Tewg, P. Majhi,

... verify the processing condition effects (film thicknesses and post metal annealing temperatures) on times to breakdown. The leakage current characteristics are improved with post metal annealing temperatures (PMA) for both 2.5 and ...

Tópico(s): Ferroelectric and Negative Capacitance Devices

2005 - Elsevier BV | Microelectronics Reliability

Artigo Revisado por pares

Pengfei Guo, Genquan Han, Xiao Gong, Bin Liu, Yue Yang, Wei Wang, Qian Zhou, Jisheng Pan, Zheng Zhang, Eng Soon Tok, Yee‐Chia Yeo,

... the gate dielectric. In addition, the effects of post metal annealing (PMA) were investigated. It was observed that ...

Tópico(s): Nanowire Synthesis and Applications

2013 - American Institute of Physics | Journal of Applied Physics

Artigo Revisado por pares

I.C. Kizilyalli, Joseph W. Lyding, K. Hess,

... dynamics and resultant damage. Therefore, deuterium and hydrogen post-metal anneal processes are compatible with each other in ...

Tópico(s): Ion-surface interactions and analysis

1997 - Institute of Electrical and Electronics Engineers | IEEE Electron Device Letters

Artigo Revisado por pares

Kai-Chi Chuang, Kuan‐Yu Lin, Jun-Dao Luo, Wei-Shuo Li, Yi-Shao Li, Chi-Yan Chu, Huang-Chung Cheng,

Post-metal annealing (PMA) has been adopted to reduce the operation voltages of HfOx-based resistive random access ...

Tópico(s): Electronic and Structural Properties of Oxides

2017 - Institute of Physics | Japanese Journal of Applied Physics

Artigo Revisado por pares

Bing‐Yue Tsui, Jung-Chien Cheng, Cheng-Tyng Yen, Chawn-Ying Lee,

... graphitization was observed in the amorphous layer after post-metal deposition (PMD) annealing. This interfacial layer strongly pinned ...

Tópico(s): Thin-Film Transistor Technologies

2017 - Elsevier BV | Solid-State Electronics

Artigo Revisado por pares

Shih-Han Yi, Kuei‐Shu Chang‐Liao, Tzung-Yu Wu, Chia‐Wei Hsu, Jiayi Huang,

... Hf-cap/GeO x gate stack with suitable post-metal-annealing (PMA) treatments. Such a high mobility in ...

Tópico(s): Ferroelectric and Negative Capacitance Devices

2017 - Institute of Electrical and Electronics Engineers | IEEE Electron Device Letters

Revisão Revisado por pares

Amit Bhoil, Hendrick Caw, Sobhan Vinjamuri,

... contribute to surgical decision making for possible osteomyelitis post-metal implant surgery. In this article, we present a ... in a few diverse clinical settings related to post-metal implant osteomyelitis.

Tópico(s): Hematological disorders and diagnostics

2019 - Lippincott Williams & Wilkins | Nuclear Medicine Communications

Artigo Revisado por pares

Shen‐Yang Lee, Hanwei Chen, Chiuan-Huei Shen, Po‐Yi Kuo, Chun-Chih Chung, Yu-En Huang, Hsin-Yu Chen, Tien‐Sheng Chao,

... of the orthorhombic phase (o-phase) before further post-metal annealing (PMA).

Tópico(s): MXene and MAX Phase Materials

2019 - Institute of Electrical and Electronics Engineers | IEEE Electron Device Letters

Artigo Acesso aberto Revisado por pares

Md. Mamunur Rahman, Dae-Hyun Kim, Tae‐Woo Kim,

... an Al2O3 interfacial layer. The effect of different post metal annealing conditions on the trap response was analyzed ...

Tópico(s): Advancements in Semiconductor Devices and Circuit Design

2020 - Multidisciplinary Digital Publishing Institute | Nanomaterials

Artigo Revisado por pares

Ryun‐Han Koo, Wonjun Shin, Kyung Kyu Min, Dongseok Kwon, Jae‐Joon Kim, Daewoong Kwon, Jong‐Ho Lee,

We investigate the effect of post-metal annealing temperature ( ${T}_{\text {PMA}}$ ) on ferroelectric (FE) resistive switching (RS) and non-FE RS in HfOx ferroelectric tunnel junctions. Through ...

Tópico(s): Ferroelectric and Piezoelectric Materials

2023 - Institute of Electrical and Electronics Engineers | IEEE Electron Device Letters

Artigo Acesso aberto Revisado por pares

Jae-Sub Oh, Hyeong-Sub Song, Jongcheol Park, Jong‐Kwon Lee,

... uncooled microbolometers. In this work, we applied the post-metal annealing (PMA) process under the condition of deuterium ...

Tópico(s): Calibration and Measurement Techniques

2021 - Multidisciplinary Digital Publishing Institute | Sensors

Revisão Acesso aberto Revisado por pares

Jagna Chmielowska-Bąk, Joanna Deckert,

... in natural conditions, plants may be subjected to post-metal-stress conditions. The review also discusses the mechanism behind efficient recovery and the impact of post metal stress on future plant performance-possible acquisition of ...

Tópico(s): Silicon Effects in Agriculture

2021 - Multidisciplinary Digital Publishing Institute | Plants

Artigo Revisado por pares

Jun-Young Park, Tae Jin Yoo, Ji‐Man Yu, Byoung Hun Lee, Yang‐Kyu Choi,

... curing characteristics depend on the device state after post-metal annealing, but no conclusive evidence has been found ...

Tópico(s): Ferroelectric and Negative Capacitance Devices

2020 - Institute of Electrical and Electronics Engineers | IEEE Electron Device Letters

Artigo Revisado por pares

Hyun-Dong Song, Hyeong-Sub Song, Sunil Babu Eadi, Hyun-Woong Choi, Hyun-Jin Shin, Jae Woo Lee, Ji‐Woon Yang, Hi‐Deok Lee,

... of tunneling field-effect transistors (TFETs). Among these, post metal annealing (PMA) can induce enhanced device performance, but ...

Tópico(s): Ferroelectric and Negative Capacitance Devices

2020 - Institute of Physics | Japanese Journal of Applied Physics

Artigo

Yu-Tseng Chu, Meng‐Hung Tsai, Cheng-Liang Huang,

... of Ar/O 2 ratio, film thickness and post metal annealing (PMA) condition on the resistive switching (RS) ... the resistive switching characteristics can be improved by post metal annealing treatment due to film densification and the ...

Tópico(s): Ferroelectric and Negative Capacitance Devices

2021 - Elsevier BV | Materials Science and Engineering B

Artigo Revisado por pares

Liang Zhang,

... a two-step annealing method. The influence of post-metal annealing (PMA) temperatures on the electrical performance and ... is also improved. In all, In2O3 TFT with post-metal annealing temperature of 350°С exhibits the best ...

Tópico(s): Silicon and Solar Cell Technologies

2021 - Elsevier BV | Current Applied Physics

Artigo Revisado por pares

J. L. Lewis, Michael J. Askew, D P Jaycox,

... condylar components. Of the designs considered, a single-post, metal-backed design provided the lowest system stresses over- ...

Tópico(s): Knee injuries and reconstruction techniques

1982 - Wolters Kluwer | Journal of Bone and Joint Surgery

Artigo Revisado por pares

Viktor Zekeriya, T. P.,

... samples, and among the dry oxide samples, the post-metal-anneal (PMA) treatment results in an appreciable reduction ...

Tópico(s): Ion-surface interactions and analysis

1983 - American Institute of Physics | Applied Physics Letters

Artigo Revisado por pares

M. R. Chin, T. P.,

... density of radiation-induced interface traps in a post-metal-annealed (PMA) Al-gate metal-oxide-semiconductor (metal/ ...

Tópico(s): Integrated Circuits and Semiconductor Failure Analysis

1983 - American Institute of Physics | Applied Physics Letters