... measured results on a 4 K dynamic MOS RAM, CMOS shift register and a TTL logic IC are ...
Tópico(s): CCD and CMOS Imaging Sensors
1980 - Elsevier BV | Microelectronics Reliability
G. J. Brucker, J. M. Herbert, Roger G. Stewart, D. Plus,
... results. Predictions of logic upset for a 4K RAM CMOS/SOS compared with measured upset rates showed agreement ...
Tópico(s): Electrostatic Discharge in Electronics
1986 - Institute of Electrical and Electronics Engineers | IEEE Transactions on Nuclear Science