Entrada de Referência

X-Ray Fluorescence Spectrometry

2010; Linguagem: Inglês

10.1002/14356007.b05_675.pub2

Autores

Roberto Cesareo,

Tópico(s)

Advanced X-ray and CT Imaging

Resumo

The article contains sections titled: 1. Introduction 2. Properties of X Rays 3. Interaction of X Rays with Matter 3.1. Photoelectric Effect 3.2. Scattered Radiation 4. Attenuation of X Rays in Matter 5. Penetration of X Rays 6. Instrumentation 6.1. X-Ray Sources 6.2. X-Ray Detectors 6.3. Geometrical Considerations 6.4. X-Ray Optics 6.5. Single- and Multichannel Analyzers 7. Samples for EDXRF Analysis 7.1. Count–Concentration Relationship for X Rays of a Given Element 7.2. Thin Samples 7.3. Thick Samples 8. X-Ray Fluorescence Spectrometers 9. Optimization of an EDXRF Spectrometer 10. X-Ray Spectrum 11. Quantification of XRF Analysis 12. Radiation Doses in EDXRF Analysis 12.1. In vitro XRF Analysis 12.2. In vivo XRF analysis 13. Wavelength-Dispersive X-Ray Systems 14. Applications of EDXRF Analysis 14.1. Environmental Samples 14.2. Metals and Industrial Alloys 14.3. Works of Art 14.4. Medical Sciences 14.5. Forensic Applications 15. Micro X-Ray Fluorescence 16. Grazing-Incidence X-Ray Spectrometry and Total Reflection XRF

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