Introduction to Scanning Transmission Electron Microscopy
1998; Wiley; Volume: 191; Issue: 1 Linguagem: Inglês
10.1046/j.1365-2818.1998.0381a.x
ISSN1365-2818
Autores Tópico(s)Electron and X-Ray Spectroscopy Techniques
ResumoJournal of MicroscopyVolume 191, Issue 1 p. 109-110 Introduction to Scanning Transmission Electron Microscopy By R. J. Keyse, A. J. Garratt-Reed, P. J. Goodhew and G. W. Lorimer. RMS Handbook 39. Bios Scientific Publishers, Oxford, 1997. ISBN 1 85996 066 9. Paperback, 128 pages, £16.95 (£11.80 for RMS members). Peter Nellist, Peter Nellist 0Search for more papers by this author Peter Nellist, Peter Nellist 0Search for more papers by this author First published: 05 January 2002 https://doi.org/10.1046/j.1365-2818.1998.0381a.xCitations: 2Read the full textAbout ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onEmailFacebookTwitterLinkedInRedditWechat No abstract is available for this article.Citing Literature Volume191, Issue1July 1998Pages 109-110 RelatedInformation
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