In-situ X-ray photoemission spectroscopy of layered structure
1993; Elsevier BV; Volume: 54; Issue: 10 Linguagem: Inglês
10.1016/0022-3697(93)90168-q
ISSN1879-2553
AutoresNorio Terada, Shoji Ishibashi, Masatoshi Jo, Masayuki Hirabayashi, Hideo Ihara,
Tópico(s)Electronic and Structural Properties of Oxides
ResumoIn-situ X-ray photoemission spectroscopy has been performed on the surface of the [SrCuO2]n[CaCuO2]m artificial structure with so-called infinite stack of CuO2 sheets. The dependence of their valence band spectra on the termination of the film growth and the comparison with the SrCuO2 and CaCuO2 single layers have been studied. With an increase the number of the SrCuO2 blocks that cover the outermost region of the samples, an edge like structure around Fermi level appears, which is more apparent than in the single layered SrCuO2. On the case of the surface terminated at the CuO2 layer of the CaCuO2 block or of the SrCuO2 block adjacent to the CaCuO2, a broadened tails around Fermi level were only observed. These results indicate that the artificial stacking of the kinds of the infinite-layer blocks offers to control their electronic structures close to the Fermi level.
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