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Relaxor ferroelectricity in strained epitaxial SrTiO3 thin films on DyScO3 substrates

2006; American Institute of Physics; Volume: 88; Issue: 19 Linguagem: Inglês

10.1063/1.2198088

1520-8842

Michael D. Biegalski, Yan Jia, Darrell G. Schlom, Susan Trolier‐McKinstry, S. K. Streiffer, Vladimir O. Sherman, R. Uecker, P. Reiche,

Microwave Dielectric Ceramics Synthesis

The ferroelectric properties of 500Å thick strained, epitaxial SrTiO3 films grown on DyScO3 substrates by reactive molecular-beam epitaxy are reported. Despite the near 1% biaxial tensile strain, the x-ray rocking curve full widths at half maximum in ω are as narrow as 7arcsec (0.002°). The films show a frequency-dependent permittivity maximum near 250K that is well fit by the Vogel-Fulcher equation. A clear polarization hysteresis is observed below the permittivity maximum, with an in-plane remanent polarization of 10μC∕cm2 at 77K. The high Tmax is consistent with the biaxial tensile strain state, while the superimposed relaxor behavior is likely due to defects.