Electron probe microanalysis using soft X‐rays – a review. Part 1: Instrumentation, spectrum processing and detection sensitivity
2001; Wiley; Volume: 201; Issue: 1 Linguagem: Inglês
10.1046/j.1365-2818.2001.00789.x
ISSN1365-2818
Autores Tópico(s)Advanced Electron Microscopy Techniques and Applications
ResumoJournal of MicroscopyVolume 201, Issue 1 p. 1-32 Electron probe microanalysis using soft X-rays – a review. Part 1: Instrumentation, spectrum processing and detection sensitivity INVITED REVIEW G. Love, G. Love Centre for Electron Optical Studies, Department of Engineering and Applied Science, University of Bath, Bath BA2 7AY, U.K.Search for more papers by this authorV. D. Scott, V. D. Scott Centre for Electron Optical Studies, Department of Engineering and Applied Science, University of Bath, Bath BA2 7AY, U.K.Search for more papers by this author G. Love, G. Love Centre for Electron Optical Studies, Department of Engineering and Applied Science, University of Bath, Bath BA2 7AY, U.K.Search for more papers by this authorV. D. Scott, V. D. Scott Centre for Electron Optical Studies, Department of Engineering and Applied Science, University of Bath, Bath BA2 7AY, U.K.Search for more papers by this author First published: 21 December 2001 https://doi.org/10.1046/j.1365-2818.2001.00789.xCitations: 9 Dr G. Love. Tel.: +44 (0)1225 826681; fax: +44 (0)1225 826098; e-mail: [email protected] Read the full textAboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL References Agnello, R., Howard, J., McCarthy, J. & Ohara, D. (1997) The use of collimating X-ray optics for wavelength dispersive spectroscopy. 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