Direct observation of grain orientation in YBa 2 Cu 3 O 7-δ thin films
1990; Taylor & Francis; Volume: 62; Issue: 2 Linguagem: Inglês
10.1080/09500839008203742
ISSN1362-3036
AutoresM. Grant Norton, Stuart McKernan, C. Barry Carter,
Tópico(s)ZnO doping and properties
ResumoAbstract Using a recently developed specimen-preparation technique to examine heteroepitactic growth in ceramics, the early development of grain orientation in thin YBa2 Cu3 O7-δ films prepared by pulsed-laser ablation can be determined. The technique involves deposition directly on to a specially prepared electron-transparent substrate. The films are examined during the early stages of growth by transmission electron microscopy. Three different orientations corresponding to different alignments of the c axis of the YBa2 Cu3 O7-delta; unit cell with the MgO substrate could be determined from the particle morphology in the image, but were not detected by selected-area diffraction due to their small size.
Referência(s)