Coulomb Blockade in Double Top Gated Si MOS Nano-Structures with Integrated Charge Sensing
2010; Cambridge University Press; Volume: 2010; Linguagem: Inglês
ISSN
0003-0503
AutoresEric Nordberg, Gregory A. Ten Eyck, Harold Lenn Stalford, Richard P. Muller, Ralph W. Young, Kevin Eng, Lisa A Tracy, K. D. Childs, J. R. Wendt, Robert K. Grubbs, Jeff Stevens, Michael Lilly, �. Eriksson, Carroll,
Tópico(s)Integrated Circuits and Semiconductor Failure Analysis
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