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BIBTEX RIS

Transmission Electron Microscopy and Diffractometry of Materials

2012; Springer Nature; Linguagem: Inglês

10.1007/978-3-642-29761-8

ISSN

1868-4521

Autores

Brent Fultz, James R. Howe,

Tópico(s)

Electron and X-Ray Spectroscopy Techniques

Resumo

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new tec

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