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Effect of substrate-induced strain on the charge-ordering transition in Nd0.5Sr0.5MnO3 thin films

1999; American Institute of Physics; Volume: 75; Issue: 3 Linguagem: Inglês

10.1063/1.124387

1520-8842

W. Prellier, Amlan Biswas, M. Rajeswari, T. Venkatesan, R. L. Greene,

Advanced Thermoelectric Materials and Devices

We report the synthesis and characterization of Nd_{0.5}Sr_{0.5}MnO_{3} thin films grown by the Pulsed Laser Deposition technique on 100 -oriented LaAlO_{3} substrates. X-ray diffraction (XRD) studies show that the films are 101 -oriented, with a strained and quasi-relaxed component, the latter increasing with film thickness. We observe that transport properties are strongly dependent on the thickness of the films. Variable temperature XRD down to 100 K suggests that this is caused by substrate induced strain on the films.