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Constant-Phase-Element Behavior Caused by Resistivity Distributions in Films

2010; Institute of Physics; Volume: 157; Issue: 12 Linguagem: Inglês

10.1149/1.3499565

1945-7111

Bryan Hirschorn, Mark E. Orazem, Bernard Tribollet, Vincent Vivier, Isabelle Frateur, Marco Musiani,

Anodic Oxide Films and Nanostructures

A normal power-law distribution of local resistivity with a uniform dielectric constant was found to be consistent with the constant-phase element (CPE). An analytic expression, based on the power-law resistivity distribution, was found that relates CPE parameters to the physical properties of a film. This expression worked well for such diverse systems as aluminum oxides, oxides on stainless steel, and human skin. Good values for film thickness were obtained, even when previously proposed expressions could not be used or yielded incorrect results. The power-law model yields a CPE impedance behavior in an appropriate frequency range, defined by two characteristic frequencies. Ideal capacitive behavior is seen above the upper characteristic frequency and below the lower characteristic frequency. A symmetric CPE response between the characteristic frequencies can be obtained by adding a parallel resistive pathway.