Portal de Periódicos da CAPES

High-Speed Integrated Circuit Testing by Time-Resolved Photoemission

1986; Springer Nature; Linguagem: Inglês

10.1007/978-3-642-82979-6_39

0172-5734

R. Clauberg, H.K. Seitz, A. Blacha, J. A. Kash, H. Beha,

VLSI and Analog Circuit Testing

The growing complexity of integrated circuits (IC) and the rapid development in VHSICs require contactless testing methods for logic state analysis and waveform measurements on internal nodes of VLSI chips. Considering the fast evolution of VLSI/VHSIC technologies, a contactless testing method has simultaneously to provide challenging features like high-voltage resolution (mV), high spatial resolution (sub-micrometer), and high time resolution (ps) in a short testing time. In addition to these requirements, it is desired that the method should be applicable to all technologies, e.g., Si as well as GaAs-based ones.