Portal de Periódicos da CAPES

Aberration-Corrected Scanning Transmission Electron Microscopy: The Potential for Nano- and Interface Science

2003; De Gruyter; Volume: 94; Issue: 4 Linguagem: Inglês

10.3139/146.030350

0044-3093

Stephen J. Pennycook, Andrew R. Lupini, A. V. Kadavanich, J. R. MeBride, Sandra J. Rosenthal, R. C. Puetter, A. Yahil, Ondrej L. Krivanek, Niklas Dellby, Peter D. Nellist, Gerd Duscher, L. G. Wang, S. T. Pantelides,

Quantum Dots Synthesis And Properties

Abstract The sub-Angstrom probe of an aberration-corrected scanning transmission electron microscope will enable imaging and analysis of nanostructures and interfaces with unprecedented resolution and sensitivity. In conjunction with first-principles theory, new insights are anticipated into the atomistic processes of growth and the subtle link between structure and functionality. We present initial results from the aberration-corrected microscopes at Oak Ridge National Laboratory that indicate the kinds of studies that will become feasible in the near future. Examples include (1) the three-dimensional location and identification of individual dopant and impurity atoms in semiconductor interfaces, and their effect on local electronic structure; (2) the accurate reconstruction of surface atomic and electronic structure on nanocrystals, and the effect on optical properties; and (3) the ability to distinguish which configurations of catalyst atoms are active, and why.