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Evidence of a minimum in refractive indexes of amorphous Ge x Te 100− x films: Relevance to the development of infrared waveguides

2014; Wiley; Volume: 211; Issue: 4 Linguagem: Inglês

10.1002/pssa.201330407

1862-6319

Caroline Vigreux, A. Piarristeguy, Raphaël Escalier, Stéphane Ménard, Marc Barillot, A. Pradel,

Glass properties and applications

Investigation of Ge x Te 100− x amorphous films deposited by thermal co‐evaporation in a large zone of compositions revealed the presence of a minimum in the evolution of the refractive index in the range x ∈ [22;35]. Such a minimum has a great impact on the control of the film refractive index, an undeniable advantage for the manufacture of infrared waveguides. Indeed a similar fluctuation in the film composition in this zone during deposition results in a decrease in refractive index fluctuation by a factor of ∼10 as compared to variation observed in other regions. On the left: planar waveguide formed by a Ge x Te 100− x deposited onto an As 2 Se 3 bulk glass; on the right: output of the m ‐lines experiment in the near infrared.