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Determination of X-Ray Photoemission Line-Shape Asymmetries from Threshold Exponents

1975; American Physical Society; Volume: 34; Issue: 21 Linguagem: Inglês

10.1103/physrevlett.34.1320

1092-0145

John D. Dow, Donald R. Franceschetti,

X-ray Diffraction in Crystallography

The law of conservation of charge is used to express the x-ray photoemission spectroscopy (XPS) line shape of a metal in terms of its observed threshold exponents, ${\ensuremath{\alpha}}_{0}$ and ${\ensuremath{\alpha}}_{1}$, within the framework of the many-electron theories of Doniach, Sunjic, Mahan, Nozi\`eres, and de Dominicis. The many-body theory predicts an anomalous dependence of XPS asymmetry on conduction-electron density: With increasing density, the XPS line should become more symmetric.