Observation of an Exponential FeSi Spacer Thickness Dependence of the Antiferromagnetic Exchange Coupling in Fe/Si-Based Multilayers
1997; Cambridge University Press; Volume: 475; Linguagem: Inglês
10.1557/proc-475-593
ISSN1946-4274
AutoresJ. T. Kohlhepp, J. J. de Vries, F. J. A. den Broeder, R. Coehoorn, R. Jungblut, Angèle Reinders, Gustav J. Strijkers, Armand Smits, W. J. M. de Jonge,
Tópico(s)Magnetic Properties and Applications
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