Observation of an Exponential FeSi Spacer Thickness Dependence of the Antiferromagnetic Exchange Coupling in Fe/Si-Based Multilayers

1997; Cambridge University Press; Volume: 475; Linguagem: Inglês

10.1557/proc-475-593

ISSN

1946-4274

Autores

J. T. Kohlhepp, J. J. de Vries, F. J. A. den Broeder, R. Coehoorn, R. Jungblut, Angèle Reinders, Gustav J. Strijkers, Armand Smits, W. J. M. de Jonge,

Tópico(s)

Magnetic Properties and Applications

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