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XPS: binding energy calibration of electron spectrometers 5?re-evaluation of the reference energies

1998; Wiley; Volume: 26; Issue: 9 Linguagem: Inglês

10.1002/(sici)1096-9918(199808)26

1096-9918

M. P. Seah, Ian S. Gilmore, G. Beamson,

X-ray Diffraction in Crystallography

Surface and Interface AnalysisVolume 26, Issue 9 p. 642-649 Research Article XPS: binding energy calibration of electron spectrometers 5—re-evaluation of the reference energies M. P. Seah, Corresponding Author M. P. Seah Centre for Materials Measurement and Technology, National Physical Laboratory, Teddington, Middlesex TW11 0LW, UKCentre for Materials Measurement and Technology, National Physical Laboratory, Teddington, Middlesex TW11 0LW, UKSearch for more papers by this authorI. S. Gilmore, I. S. Gilmore Centre for Materials Measurement and Technology, National Physical Laboratory, Teddington, Middlesex TW11 0LW, UKSearch for more papers by this authorG. Beamson, G. Beamson Daresbury Laboratory, Daresbury, Warrington, Cheshire WA4 4AD, UKSearch for more papers by this author M. P. Seah, Corresponding Author M. P. Seah Centre for Materials Measurement and Technology, National Physical Laboratory, Teddington, Middlesex TW11 0LW, UKCentre for Materials Measurement and Technology, National Physical Laboratory, Teddington, Middlesex TW11 0LW, UKSearch for more papers by this authorI. S. Gilmore, I. S. Gilmore Centre for Materials Measurement and Technology, National Physical Laboratory, Teddington, Middlesex TW11 0LW, UKSearch for more papers by this authorG. Beamson, G. Beamson Daresbury Laboratory, Daresbury, Warrington, Cheshire WA4 4AD, UKSearch for more papers by this author First published: 21 December 1998 https://doi.org/10.1002/(SICI)1096-9918(199808)26:9 3.0.CO;2-3Citations: 237AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinkedInRedditWechat Abstract The binding energies of the calibration peaks for x-ray photoelectron spectroscopy—Cu 2p3/2, Ag 3d5/2 and Au 4f7/2—have been reassessed based on the traceable data recorded in 1984 using unmonochromated x-rays and an analyser resolution of 0.3 eV. The changes in those energies, for different x-ray sources and analyser resolutions, have been calculated and the results compared with further data. This includes work with monochromatic Al x-rays recorded at high energy resolution, allowing the binding energies to be referred to a new zero value set at the Fermi edge measured for Ag. A consistent set of data is presented for the calibration and assessment of photoelectron spectrometers with energy resolutions in the range 0.2–1.5 eV, when used with unmonochromated Al or Mg x-rays or monochromated Al x-rays. © 1998 John Wiley & Sons, Ltd. Citing Literature Volume26, Issue9August 1998Pages 642-649 RelatedInformation