The SEM examination of wet specimens
1978; Wiley; Volume: 1; Issue: 3 Linguagem: Inglês
10.1002/sca.4950010301
ISSN1932-8745
Autores Tópico(s)Surface Roughness and Optical Measurements
ResumoScanningVolume 1, Issue 3 p. 149-156 ReviewFree to Read The SEM examination of wet specimens V. N. E. Robinson, V. N. E. Robinson Faculty of Applied Science, The University of New South Wales, P. O. Box 1, Kensington, N.S.W., 2033, AustraliaSearch for more papers by this author V. N. E. Robinson, V. N. E. Robinson Faculty of Applied Science, The University of New South Wales, P. O. Box 1, Kensington, N.S.W., 2033, AustraliaSearch for more papers by this author First published: 1978 https://doi.org/10.1002/sca.4950010301Citations: 28AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onEmailFacebookTwitterLinkedInRedditWechat References Anderson T F: Techniques for preservation of 3-dimensional structure in preparing specimens for electron microscopy. Trans NY Acad Sci 13, 130 (1951) 10.1111/j.2164-0947.1951.tb01007.x Web of Science®Google Scholar Anderson T F: Electron Microscopy of microorganisms. In: Physical Techniques in Biological Research ( G. Oster and A. Pollister eds.), 177–240 Academic Press, New York, Vol. 3, 1956 Google Scholar Boyde A: Histological and cytological methods for the SEM in biology and medicine. In: Scanning Electron Microscopy ( OC Wells, ed.) McGraw Hill, New York, Chapter 12, 1974 Google Scholar Boyde A: Do's and don'ts of biological specimen preparation for the SEM. Scanning Electron Microscopy 1976/I, IITRI, Chicago, pp 683–690 Google Scholar Boyde A, Bailey E, Jones S J, Tamarin A: Dimensional changes during specimen preparation for scanning electron microscopy. 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