Artigo Revisado por pares

Fourier-transform photocurrent spectroscopy of microcrystalline silicon for solar cells

2002; American Institute of Physics; Volume: 80; Issue: 5 Linguagem: Inglês

10.1063/1.1446207

ISSN

1520-8842

Autores

M. Vaněček, A. Poruba,

Tópico(s)

Silicon Nanostructures and Photoluminescence

Resumo

The spectral dependence of the optical absorption coefficient in thin films of hydrogenated microcrystalline silicon is measured over nine orders of magnitude in the subgap, defect-connected region, and in the above-the-band gap region. Transmittance, reflectance, and constant photocurrent method measurements are combined with Fourier-transform photocurrent spectroscopy (FTPS). Results are analyzed and interpreted as due to electron transitions from defects or interband electron transitions, all having direct relevance to the thin-film microcrystalline silicon solar cell performance. FTPS is a fast and sensitive quantitative method for quality assessment of microcrystalline silicon absorber in solar cells and can be used for quality monitoring in solar cell production.

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