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Comment on “Memory Effect and Negative Differential Resistance by Electrode‐Induced Two‐Dimensional Single‐Electron Tunneling in Molecular and Organic Electronic Devices”

2006; Volume: 18; Issue: 21 Linguagem: Inglês

10.1002/adma.200600008

1521-4095

Himadri S. Majumdar, Jayanta K. Baral, Ari Laiho, Janne Ruokolainen, Olli Ikkala, Ronald Österbacka,

Quantum and electron transport phenomena

Advanced MaterialsVolume 18, Issue 21 p. 2805-2806 Correspondence Comment on “Memory Effect and Negative Differential Resistance by Electrode-Induced Two-Dimensional Single-Electron Tunneling in Molecular and Organic Electronic Devices” H. S. Majumdar, H. S. Majumdar [email protected] Department of Physics, Åbo Akademi University, Porthansgatan 3, 20500 Turku, FinlandSearch for more papers by this authorJ. K. Baral, J. K. Baral Department of Physics, Åbo Akademi University, Porthansgatan 3, 20500 Turku, FinlandSearch for more papers by this authorA. Laiho, A. Laiho Department of Engineering Physics and Mathematics and Center for New Materials, Helsinki University of Technology, PO Box 2200, 02015 HUT, Espoo, FinlandSearch for more papers by this authorJ. Ruokolainen, J. Ruokolainen Department of Engineering Physics and Mathematics and Center for New Materials, Helsinki University of Technology, PO Box 2200, 02015 HUT, Espoo, FinlandSearch for more papers by this authorO. Ikkala, O. Ikkala Department of Engineering Physics and Mathematics and Center for New Materials, Helsinki University of Technology, PO Box 2200, 02015 HUT, Espoo, FinlandSearch for more papers by this authorR. Österbacka, R. Österbacka Department of Physics, Åbo Akademi University, Porthansgatan 3, 20500 Turku, FinlandSearch for more papers by this author H. S. Majumdar, H. S. Majumdar [email protected] Department of Physics, Åbo Akademi University, Porthansgatan 3, 20500 Turku, FinlandSearch for more papers by this authorJ. K. Baral, J. K. Baral Department of Physics, Åbo Akademi University, Porthansgatan 3, 20500 Turku, FinlandSearch for more papers by this authorA. Laiho, A. Laiho Department of Engineering Physics and Mathematics and Center for New Materials, Helsinki University of Technology, PO Box 2200, 02015 HUT, Espoo, FinlandSearch for more papers by this authorJ. Ruokolainen, J. Ruokolainen Department of Engineering Physics and Mathematics and Center for New Materials, Helsinki University of Technology, PO Box 2200, 02015 HUT, Espoo, FinlandSearch for more papers by this authorO. Ikkala, O. Ikkala Department of Engineering Physics and Mathematics and Center for New Materials, Helsinki University of Technology, PO Box 2200, 02015 HUT, Espoo, FinlandSearch for more papers by this authorR. Österbacka, R. Österbacka Department of Physics, Åbo Akademi University, Porthansgatan 3, 20500 Turku, FinlandSearch for more papers by this author First published: 30 October 2006 https://doi.org/10.1002/adma.200600008Citations: 7AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onEmailFacebookTwitterLinkedInRedditWechat No abstract is available for this article. REFERENCES 1 W. Tang, H. Shi, G. Xu, B. S. Ong, Z. D. Popovic, J. Deng, J. Zhao, G. Rao, Adv. Mat. 2005, 17, 2307. 10.1002/adma.200500232 CASWeb of Science®Google Scholar 2 M. Shin, S. Lee, K. W. Park, E. Lee, Phys. Rev. Lett. 1998, 80, 5774. 10.1103/PhysRevLett.80.5774 CASWeb of Science®Google Scholar 3 H. S. Majumdar, J. K. Baral, R. Österbacka, O. Ikkala, H. Stubb, Org. Electron. 2005, 6, 188. 10.1016/j.orgel.2005.06.005 CASWeb of Science®Google Scholar 4 L. Ma, J. Liu, S. Pyo, Y. Yang, Appl. Phys. Lett. 2003, 82, 1419. 10.1063/1.1556555 CASWeb of Science®Google Scholar Citing Literature Volume18, Issue21November, 2006Pages 2805-2806 ReferencesRelatedInformation