Imaging of layered semiconductor clusters by scanning tunneling microscopy: Bi2S3 on graphite and gold substrates
1988; American Institute of Physics; Volume: 53; Issue: 2 Linguagem: Inglês
10.1063/1.100574
ISSN1520-8842
AutoresT. W. Jing, N. P. Ong, C. J. Sandroff,
Tópico(s)Molecular Junctions and Nanostructures
ResumoWe present scanning tunneling microscope images of Bi2S3 clusters deposited on the surfaces of graphite and gold. We observed similar images on both substrates, discerning the disk-like structures expected for clusters having layered symmetry. The images of highest quality were obtained for 600-atom clusters roughly 100 Å in lateral extent and 25 Å thick. The difficulty in characterizing clusters with smaller lateral dimension suggests that clusters must be bound to the surface with a critical adsorption energy in order to obtain stable images.
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