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Light-deflection effects in the interferometry of one-dimensional refractive-index fields

1973; Optica Publishing Group; Volume: 63; Issue: 5 Linguagem: Inglês

10.1364/josa.63.000559

2375-1037

Kirk W. Beach, Rolf Müller, Charles W. Tobias,

Force Microscopy Techniques and Applications

Distortions in interferograms of refractive-index fields due to deviations from straight-line propagation have been analyzed numerically. Quantitative refractive-index profiles can often not be derived in a simple way from interferograms. The choice of the plane of focus and the alignment of the object with respect to the light direction are found to affect the distortions greatly. Results for typical examples of refractive-index fields encountered in different electrochemical systems are given.