Section III: High magnification scanning electron microscopy
1986; Wiley; Volume: 4; Issue: 2 Linguagem: Inglês
10.1002/jemt.1060040205
ISSN1553-0817
Autores Tópico(s)Anodic Oxide Films and Nanostructures
ResumoJournal of Electron Microscopy TechniqueVolume 4, Issue 2 p. 102-113 Article Section III: High magnification scanning electron microscopy Dr. Klaus-Ruediger Peters, Corresponding Author Dr. Klaus-Ruediger Peters Department of Cell Biology, Yale University School of Medicine, New Haven, Connecticut 06510Department of Cell Biology, Yale University School of Medicine, 333 Cedar Street, New Haven, CT 06510Search for more papers by this author Dr. Klaus-Ruediger Peters, Corresponding Author Dr. Klaus-Ruediger Peters Department of Cell Biology, Yale University School of Medicine, New Haven, Connecticut 06510Department of Cell Biology, Yale University School of Medicine, 333 Cedar Street, New Haven, CT 06510Search for more papers by this author First published: 1986 https://doi.org/10.1002/jemt.1060040205Citations: 6AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onEmailFacebookTwitterLinkedInRedditWechat References Bearer, E. L., Orci, L. (1985) Endothelial fenestral diaphrams: A quick-freeze, deep-etch study. J. Cell Biol. 100: 418–428. 10.1083/jcb.100.2.418 PubMedWeb of Science®Google Scholar Boyde, A., Bailey, E., Jones, S. J., and Tamarin, A. (1977) Dimensional changes during specimen preparation for scanning electron microscopy. Scanning Electron Microscopy, 1977. Vol. I: 507–518, 580. Google Scholar Boyles, J. (1984) The use of primary amines to improve glutaraldehyde fixation. In: J.-P. Revel, T. Barnard, G. H. Haggis, and S. A. Bhatt (eds.) The Science of Biological Specimen Preparation for Microscopy and Microanalysis. AMF O'Hare, IL: Scanning Electron Microscopy Inc., pp. 7–21. Google Scholar Bradley, D. E. (1958) Simultaneous evaporation of Pt and carbon for possible use in high-resolution shadow-casting for the electron microscope. Nature 181: 875–877. 10.1038/181875a0 CASPubMedWeb of Science®Google Scholar Broers, A. N., Panessa, B. J., and Gennaro, J. F. (1975) High resolution SEM of biological specimens. Scanning Electron Microscopy. pp. 233–242. Google Scholar Crewe, A. V. (1985) Towards the ultimate scanning electron microscope. Scanning Electron Microscopy pp. 467–472. Google Scholar Crewe, A. V., Wall, J., and Welter, L. M. (1968) High resolution scanning transmission electron microscope. J. Appl. Phys. 39: 5861–5868. 10.1063/1.1656079 Web of Science®Google Scholar DeHarven, E., Leung, R., and Christensen, H. (1984) A novel approach for scanning electron microscopy of collodial gold-labeled cell surfaces. J. Cell Biol. 99: 53–57. 10.1083/jcb.99.1.53 PubMedWeb of Science®Google Scholar Echlin, P. (1972) The rationale and mode of application of thin films to non-conducting materials. Scanning Electron Microscopy I: 137–141. Google Scholar Everhart, T. E. and Chung, M. S. (1972) Idealized spatial emission distribution of secondary electrons. J. Appl. Phys. 43: 3307–3311. 10.1063/1.1661794 Web of Science®Google Scholar Haggis, G. H., and Phipps-Todd, B. (1977) Freeze-fracture for scanning electron microscopy. J. Microsc. 111: 193–201. 10.1111/j.1365-2818.1977.tb00059.x CASPubMedWeb of Science®Google Scholar Hanker, J. S., Seaman, A. R., Weiss, L. P., Ueno, H., Bergman, R. A., and Seligman, A. M. (1964) Osmiophilic reagents: New cytochemical principle for light and electron microscopy. Science 146: 1039–1043. 10.1126/science.146.3647.1039 CASPubMedWeb of Science®Google Scholar Hasselbach, F. and Rieke, U. (1976) Emission microscopical investigation of the edge brightening effect in scanning electron microscopy. 6th European Congress on Electron Microscopy. Jerusalem: Tal Pub. Co., 1: 296–298. Google Scholar Heuser, J. (1980) Three-dimensional visualization of coated vesicle formation in fibroblasts. J. Cell Biol. 85: 560–583. 10.1083/jcb.84.3.560 Web of Science®Google Scholar Humphreys, W. J., Spurlock, B. O., and Johnson, J. S. (1974) Critical point drying of ethanol-infiltrated, cryofractured biological specimens for scanning electron microscopy. Scanning Electron Microscopy. pp. 275–282. Google Scholar Inoué, T., (1983) Use of distilled water as a rinsing solution for intracellular observation by scanning electron microscopy. Scanning Electron Microscopy. pp. 227–233. Google Scholar Inoué, T. and Osatake, H. (1984) A freeze-polishing method for observing intracellular structures by scanning electron microscopy. J. Electron Microsc. 33: 356–362. CASPubMedWeb of Science®Google Scholar Isaacson, M., Langmore, J. P., and Rose, H. (1974) Determination of the non-localization of the inelastic scattering of electrons by electron microscopy. Optik 41: 92–96. Web of Science®Google Scholar Joy, D. C. (1984) Beam interactions, contrast and resolution in the SEM. J. Microsc. 136: 241–258. 10.1111/j.1365-2818.1984.tb00532.x CASWeb of Science®Google Scholar Kelley, R. O., Decker, R. A. F., and Bluemink, J. G. (1973) Ligand-mediated osmium binding: Its application in coating biological specimens for scanning electron microscopy. J. Ultrastruct. Res. 45: 254–258. 10.1016/S0022-5320(73)80051-6 CASPubMedWeb of Science®Google Scholar Kerjaschki, D., Sharkey, D. J., and Farquhar, M. G. (1984) Identification and characterization of podocalyxin—the major sialoprotein of the renal glomerular epithelial cell. J. Cell Biol. 98: 1591–1596. 10.1083/jcb.98.4.1591 CASPubMedWeb of Science®Google Scholar Kistler, J. and Kellenberger, E. (1977) Collapse phenomena in freeze-drying. J. Ultrastruct. Res. 59: 70–75. 10.1016/S0022-5320(77)80029-4 CASPubMedWeb of Science®Google Scholar Knoll, M. (1935) Aufladepotential und Sekundäremission elektronenbestrahlter Körper. Z. Tech. Phys. 16: 467–475. Google Scholar Knoll, M. and Ruska, E. (1932) Das Elektronenmikroskop. Z. Physik 78: 318–339. 10.1007/BF01342199 CASGoogle Scholar Komoda, T. and Saito, S. (1972) Experimental resolution limit in the secondary mode for a field emission source scanning electron microscope. Scanning Electron Microscopy. I: 129–136. Google Scholar Mahl, H. (1942) Die übermikroskopische Oberflächendarstellung mit dem Abdruckverfahren. Naturwissenschaften 30: 207–217. 10.1007/BF01481222 CASWeb of Science®Google Scholar Mazia, D., Schatten, G. A., and Sale, W. (1975) Adhesion of cells to surfaces coated with polylysine. Application to electron microscopy. J. Cell Biol. 66: 198–200. 10.1083/jcb.66.1.198 PubMedWeb of Science®Google Scholar Moor, H. (1959) Platin-Kohle-Abdruck-Technik angewandt auf den Feinbau der Milchröhren. J. Ultrastruc. Res. 2: 393–422. 10.1016/S0022-5320(59)90003-6 Web of Science®Google Scholar Müller, H. O. (1942) Die Ausmessung der Tiefe übermikroskopischer Objekte. Kolloid Z. 99: 6–28. 10.1007/BF01496994 CASGoogle Scholar Murakami, T., Iida, N., Taguchi, T., Ohtani, O., Kikuta, A., Ohtsuka, A., and Itoshima, T. (1983) Conductive staining of biological specimens for scanning electron microscopy with special reference to ligand-mediated osmium impregnation. Scanning Electron Microscopy. pp. 235–246. Google Scholar Nermut, M. V. (1982) The „cell monolayer technique”︁ in membrane research. Eur. J. Cell Biol. 28: 160–172. PubMedWeb of Science®Google Scholar Palade, G. E. (1952) A study of fixation for electron microscopy. J. Exp. Med. 95: 285–298. 10.1084/jem.95.3.285 CASPubMedWeb of Science®Google Scholar Pawley, J. (1984) Low voltage scanning electron microscopy. J. Micros. 136: 45–68. 10.1111/j.1365-2818.1984.tb02545.x PubMedWeb of Science®Google Scholar Peters, K.-R. (1980) Penning sputtering of ultra thin films for high resolution electron microscopy. Scanning Electron Microscopy. I: 143–154. Google Scholar Peters, K.-R. (1982a) Validation of George and Robinson SE-I signal theorem. Implication for ultrahigh resolution SEM on bulk untitled specimens. In G. W. Bailey (ed.): Fortieth Annual Meeting Electron Microscopy Society America. Baton Rouge, LS: Claitor's Publ. Div., pp. 368–369. Web of Science®Google Scholar Peters, K.-R. (1982b) Conditions required for high quality high magnification images in secondary electron-I scanning electron microscopy. Scanning Electron Microscopy. pp. 1359–1372. Google Scholar Peters, K.-R. (1984a) Generation, collection and properties of an SE-I enriched signal suitable for high resolution SEM on bulk specimens. In D. F. Kayser, H. Niedrig, D. E. Newbury, and R. Shimizu (eds.): Electron Beam Interactions with Solids for Microscopy, Microanalysis α Microlithoraphy. AMF O'Hare, IL: Scanning Electron Microscopy Inc., pp. 363–372. Google Scholar Peters, K.-R. (1984b) Scanning electron microscopy: Contrast at high magnification. In A. D. Romig and J. I. Goldstein (eds.): Microbeam Analysis—1984. San Francisco: San Francisco Press Inc., pp. 77–80. Google Scholar Peters, K.-R. (1985a) Working at higher magnification in scanning electron microscopy with secondary and backscattered electrons on metal coated biological specimens and imaging macromolecular cell membrane structures. Scanning Electron Microscopy. pp. 1519–1544. Google Scholar Peters, K.-R. (1985b) Noise reduction in high-magnification micrographs by soft focus printing and digital image processing. Scanning 7: 205–215. 10.1002/sca.4950070405 PubMedGoogle Scholar Peters, K.-R. (1986a) Metal deposition by high-energy sputtering for high magnification electron microscopy. In J. K. Koehler (ed.): Advanced Techniques in Biological Electron Microscopy III. Berlin-Heidelberg-New York: Springer-Verlag. 10.1007/978-3-642-71135-0_3 Google Scholar Peters, K.-R. (1986b) Rational for the application of thin, continuous metal films in high magnification electron microscopy. J. Microsc. 142: 25–34. 10.1111/j.1365-2818.1986.tb02734.x PubMedWeb of Science®Google Scholar Peters, K.-R., and Green, S. A. (1983) Macromolecular structures of biological specimens are not obscured by controlled osmium impregnation. In G. W. Bailey (ed.): Forty-first Annual Meetin Electron Microscopy Society America. San Francisco: San Francisco Press Inc., pp. 606–607. Google Scholar Peters K.-R. and Milici, A. J. (1983) High resolution scanning electron microscopy of the luminal surface of a fenestrated capillary endothelium. J. Cell Biol. 97: 336a (abstract). Google Scholar Peters K.-R. and Milici, A. J. (1985) Endothelial pockets are new transendothelial structures expressed by individual cells in renal fenestrated peritubular capillaries. J. Cell Biol. 101: 110a (abstract). Google Scholar Peters, K.-R., Palade, G. E., Schneider, B. G., and Papermaster, D. S. (1983) Fine structure of a periciliary ridge complex of frog retinal rod cells revealed by ultrahigh resolution scanning electron microscopy. J. Cell Biol. 96: 265–276. 10.1083/jcb.96.1.265 CASPubMedWeb of Science®Google Scholar Peters, K.-R., Carley, W. W., and Palade, G. E. (1985) Endothelial plasmalemmal vesicles have a characteristic striped bipolar surface structure. J. Cell Biol., 101: 2233–2238. 10.1083/jcb.101.6.2233 CASPubMedWeb of Science®Google Scholar Seiler, H. (1983) Secondary electron emission in the SEM. J. Appl. Phys. 54: R1–R18. 10.1063/1.332840 CASWeb of Science®Google Scholar Tanaka, K. (1981) Demonstration of intracellular structures by high resolution scanning electron microscopy. Scanning Electron Microscopy. I: 1–8. Google Scholar Wells, O. C. (1971) Low-loss imnage for surface scanning electron microscope. App. Phys. Lett. 19: 232–235. 10.1063/1.1653899 CASWeb of Science®Google Scholar Wells, O. C. (1972) Explanation of the low-loss image in the SEM in terms of electron scattering theory. Scanning Electron Microscopy. pp. 169–176. Google Scholar Wells, O. C. (1975) Measurements of low-loss electron emission from amorphous targets. Scanning Electron Microscopy. I: 43–50, 132. Google Scholar Williams, R. C. and Wyckoff, R. W. G. (1944) The thickness of electron microscopic objects. J. Appl. Phys. 15: 712–716. 10.1063/1.1707376 CASWeb of Science®Google Scholar Zworykin, V. K. and Ramberg, E. G. (1941) Surface studies with the electron microscope. J. Appl. Phys. 12: 692–695. 10.1063/1.1712962 CASWeb of Science®Google Scholar Citing Literature Volume4, Issue21986Pages 102-113 ReferencesRelatedInformation
Referência(s)