Artigo Revisado por pares

Elaboration and characterization of InAsSb grown on GaSb and GaAs substrates

1995; Elsevier BV; Volume: 148; Issue: 1-2 Linguagem: Inglês

10.1016/0022-0248(94)00828-0

ISSN

1873-5002

Autores

Alain Giani, Jean Podlecki, F. Pascal‐Delannoy, G. Bougnot, L. Gouskov, C. Catinaud,

Tópico(s)

Nanowire Synthesis and Applications

Resumo

We study the growth of InAs0.91Sb0.09 lattice matched on GaSb presenting a bandgap of 0.29 eV (4.2 μm) at 300 K. The layers are grown on (100) GaSb and GaAs substrates at atmospheric pressure in a vertical reactor MOVPE (metal organic vapor phase epitaxy) system using trimethylindium (TMIn), trimethylantimony (TMSb) and arsine (AsH3). We report the results on growth rate and InSb incorporation versus growth parameters as temperature and TMSb partial pressure for different VIII ratios. Carrier density and mobility of InAsSb undoped layers are given. Optical photoconductivity measurements are presented with a wavelength cut off up to 5.4 μm at 300 K, and the absorption by atmospheric CO2 at 4.25 μm is clearly detected. The I-V curves of (n)InAsSb/(n and p)GaSb heterojunctions are presented. At room temperature, the dark current for the n/n heterostructure is 70 μA at −1 V, while the n/p junction is ohmic.

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