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Statistic properties of dislocation structures investigated by X-ray diffraction

2001; Elsevier BV; Volume: 309-310; Linguagem: Inglês

10.1016/s0921-5093(00)01629-4

1873-4936

Ferenc Székely, István Groma, J. Lendvai,

Theoretical and Computational Physics

The method of X-ray line profile analysis was applied to obtain statistical parameters (average dislocation density, net dislocation polarization and average dislocation density fluctuation) of the dislocation structure developed in copper single crystals deformed in uniaxial compression. It is found that during the plastic deformation, while the dislocation density increases monotonously, the average fluctuation has a maximum at the transition from stage II to stage III work hardening. The fractal properties of the dislocation structure are also investigated. Strong correlation was found between the fractal dimension and the relative dislocation density fluctuation.