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Scanning Tunneling Microscopy Study of the Thick Film Limit of Kinetic Roughening

1994; American Physical Society; Volume: 73; Issue: 26 Linguagem: Inglês

10.1103/physrevlett.73.3564

1092-0145

G. Palasantzas, J. Krim,

nanoparticles nucleation surface interactions

The spatial and temporal scaling behaviors of vapor-deposited silver films have been investigated by means of scanning tunneling microscopy for the film thickness range \ensuremath{\cong}10-1000 nm. The roughness, growth, and dynamic scaling exponents have been independently measured ($\ensuremath{\alpha}=0.82\ifmmode\pm\else\textpm\fi{}0.05,\ensuremath{\beta}=0.29\ifmmode\pm\else\textpm\fi{}0.06, \mathrm{and} z=2.5\ifmmode\pm\else\textpm\fi{}0.5$), and they exhibit no evolution with film thickness.