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The Microdiagnostics for the IBM System 360 Model 30

1971; Institute of Electrical and Electronics Engineers; Volume: C-20; Issue: 7 Linguagem: Inglês

10.1109/t-c.1971.223349

2326-3814

Adrian M. Johnson,

Industrial Vision Systems and Defect Detection

This report describes the microdiagnostics which were developed for incorporation into the IBM System 360 Model 30 maintenance package. These microdiagnostics enable the System 360 Model 30 to develop internal diagnostics with fault detection and location capabilities, and led to a reduction in the amount of training and service equipment required to adequately service the system.