The Microdiagnostics for the IBM System 360 Model 30
1971; Institute of Electrical and Electronics Engineers; Volume: C-20; Issue: 7 Linguagem: Inglês
10.1109/t-c.1971.223349
ISSN2326-3814
Autores Tópico(s)Industrial Vision Systems and Defect Detection
ResumoThis report describes the microdiagnostics which were developed for incorporation into the IBM System 360 Model 30 maintenance package. These microdiagnostics enable the System 360 Model 30 to develop internal diagnostics with fault detection and location capabilities, and led to a reduction in the amount of training and service equipment required to adequately service the system.
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