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X-Ray Diffraction Profile Analysis for the Determination of the Crystal Structure of BaTiO 3

1980; Institute of Physics; Volume: 19; Issue: 9 Linguagem: Inglês

10.1143/jjap.19.1757

1347-4065

Masahiro Tanaka, H. Fujishita, Yōichi Shiozaki, E. Sawaguchi,

High-pressure geophysics and materials

The profile analysis method is applied to the X-ray powder diffraction pattern of tetragonal BaTiO 3 ; a Si specimen is also examined as an initial test of the method. The accuracy with Si is nearly the same as that of the standard single crystal method. The result for BaTiO 3 powder proves that the X-ray profile analysis method is quite useful for the determination of structures, especially when no single crystals are available or the conventional single crystal method is unsatisfactory because of experimental difficulties.