Polarimetric performance of Si/CdTe semiconductor Compton camera
2010; Elsevier BV; Volume: 622; Issue: 3 Linguagem: Inglês
10.1016/j.nima.2010.07.077
ISSN1872-9576
AutoresShin’ichiro Takeda, Hirokazu Odaka, J. Katsuta, S. Ishikawa, So-ichiro Sugimoto, Yuu Koseki, Shin Watanabe, Goro Sato, M. Kokubun, Tadayuki Takahashi, K. Nakazawa, Yasushi Fukazawa, H. Tajima, Hidenori Toyokawa,
Tópico(s)Radiation Detection and Scintillator Technologies
ResumoA Compton camera has been developed based on Si and CdTe semiconductor detectors with high spatial and spectral resolution for hard X- and γ‐ray astrophysics applications. A semiconductor Compton camera is also an excellent polarimeter due to its capability to precisely measure the Compton scattering azimuth angle, which is modulated by linear polarization. We assembled a prototype Compton camera and conducted a beam test using nearly 100% linearly polarized γ‐rays at SPring-8.
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