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Imaging of crystalline substances in scanning transmission electron microscopy

1975; Wiley; Volume: 28; Issue: 1 Linguagem: Inglês

10.1002/pssa.2210280127

1521-396X

Takahisa Yamamoto, H. Nishizawa,

Anodic Oxide Films and Nanostructures

physica status solidi (a)Volume 28, Issue 1 p. 237-248 Original Paper Imaging of crystalline substances in scanning transmission electron microscopy T. Yamamoto, T. Yamamoto Jeol Ltd., Nakagami, Akishima, TokyoSearch for more papers by this authorH. Nishizawa, H. Nishizawa Jeol Ltd., Nakagami, Akishima, TokyoSearch for more papers by this author T. Yamamoto, T. Yamamoto Jeol Ltd., Nakagami, Akishima, TokyoSearch for more papers by this authorH. Nishizawa, H. Nishizawa Jeol Ltd., Nakagami, Akishima, TokyoSearch for more papers by this author First published: 16 March 1975 https://doi.org/10.1002/pssa.2210280127Citations: 13AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinked InRedditWechat Abstracten By using a scanning transmission electron microscope, a crystal containing stacking faults was observed at two different beam illuminations, an illumination in which the direct and diffracted beams were separated in the diffraction pattern and an illumination in which the said beams were overlapped. The nature of the images obtained is explained by electron diffraction theory. The multi-beam imaging technique developed for high-voltage electron microscopy by Hashimoto is more useful in the scanning mode than in the conventional transmission mode. Abstractde Mit Abtast-Transmissionselektronenmikroskopie wurden Kristalle mit Stapelfehlern bei zwei unterschiedlichen Strahlanordnungen beobachtet, eine, bei der die direkten und gestreuten Strahlen im Beugungsbild getrennt wurden und eine, bei der die erwähnten Strahlen überlappt wurden. Die Art der erhaltenen Diagramme wird mit Elektronen-beugungstheorie erklärt. Die Mehrstrahltechnik, die für Hochspannungs-Elektronen-mikroskopie von Hashimoto entwickelt wurde, erweist sich in der Abtasttechnik nützlicher als in der üblichen Transmissionstechnik. Citing Literature Volume28, Issue116 March 1975Pages 237-248 RelatedInformation