Portal de Periódicos da CAPES

Spectrum shift fitting technique for atomic emission spectrometry

2001; Elsevier BV; Volume: 56; Issue: 4 Linguagem: Inglês

10.1016/s0584-8547(01)00164-1

1873-3565

В. Г. Гаранин, I. R. Shelpakova,

Analytical Chemistry and Chromatography

The use of the principle of additivity for the atomic emission spectra registered by a multi-element solid-state detector (SSD) requires to take into account the possible non-controlled spectrum shift. The method of solution for the problem, based on the construction of parabolic model of signal change on pixels under the spectrum shift with respect to detector, is suggested. The algorithm of the model construction depends neither on the spectral line shape nor on the spectrometer apparatus function. The method can be applied with equal success both for the short spectral regions (10–20 pixels) and for the long regions (10 000 and more pixels). The values of relative spectrum shifts can lie in a continuous range from 0.05 to 100 and more pixels. The advantages of this method are shown on the examples of subtraction of spectra in the process of registration on diffraction spectrograph PGS-2 (Carl Zeiss, Jena) with the help of a linear solid state detector (MAES-10, VMK-Optoelectronika, Russia, Novosibirsk).