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Scratching maps for polymers

1996; Elsevier BV; Volume: 200; Issue: 1-2 Linguagem: Inglês

10.1016/s0043-1648(96)07314-0

1873-2577

B.J. Briscoe, P.D. Evans, Enrico Pellilo, Sujeet K. Sinha,

Force Microscopy Techniques and Applications

The scratching technique has gained interest in recent times due to its varied applications to a number of engineering materials, especially for the evaluation of surface scratch resistance of plastics. Scratching provides a convenient and reliable means to investigate the mechanical properties of organic polymers under various contact conditions. The scratch hardness method is widely adopted to provide a first-order evaluation of the relative scratch resistance of materials for comparison purposes. The method also allows the identification and the assessment of the surface deformation processes and maps defining the scratch deformation modes as a function of contact conditions may be generated. These scratching maps may present experimental results in terms of the deformation mechanism, the scratch hardness and the friction coefficient. This paper primarily provides a review of the application of scratching maps for polymers. Results for the scratch hardness and the deformation mechanisms for a poly(methylmethacrylate) (PMMA), a poly(tetrafluoroethylene) (PTFE) and an ultra-high molecular weight poly(ethylene) (UHMWPE) are presented. The PTFE system is also described following the effects of γ-irradiation; radiation produces a marked reduction in toughness. The scratches were produced on the polymer surfaces by cones and spheres of various size under a number of contact conditions (e.g. applied normal load, strain, scratch velocity, etc.). SEM imaging and laser profilometry are used for the study of the deformation mechanisms and the measurements of the scratch profiles. It is shown that polymers exhibit a wide range of scratch deformation characteristics and that the deformation mechanism is determined by the most efficient energy dissipation process for the particular external constraints.