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Revised technical guidelines for reliable dc measurements of the quantized Hall resistance

2003; IOP Publishing; Volume: 40; Issue: 5 Linguagem: Inglês

10.1088/0026-1394/40/5/302

1681-7575

F. Delahaye, B. Jeckelmann,

Surface and Thin Film Phenomena

This paper describes the main tests and precautions necessary for both reproducible and accurate results in the use of the quantum Hall effect as a means to establish a reference standard of dc resistance having a relative uncertainty of a few parts in 109.