Simultaneous reflexion: its detection and correction for intensity perturbation

1975; International Union of Crystallography; Volume: 31; Issue: 6 Linguagem: Inglês

10.1107/s0567739475001829

ISSN

1600-8596

Autores

Kohei Tanaka, Yoshinori Saito,

Tópico(s)

X-ray Spectroscopy and Fluorescence Analysis

Resumo

The geometrical condition under which simultaneous reflexions occur with a general setting of a crystal has been formulated in three equations in terms of reciprocal-lattice vectors. A procedure is described to correct the intensity data for structure analysis for the intensity perturbation due to simultaneous reflexion. The following practical experimental conditions were taken into account: the effect due to the circumstance that the primary and secondary reflexions do not always occur exactly at the same time, the divergence and insufficient monochromatization of the incident beam, and a finite size and mosaicity of crystal specimen. The correction for simultaneous reflexion was applied to the X-ray intensity data from diformylhydrazine. It was shown that non-equal intensities among equivalent reflexions could be corrected reasonably by this method.

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