A New Low Energy Electron Microscope
1998; World Scientific; Volume: 05; Issue: 06 Linguagem: Inglês
10.1142/s0218625x98001523
ISSN1793-6667
AutoresR. M. Tromp, Marián Maňkoš, M. C. Reuter, A. W. Ellis, M. Copel,
Tópico(s)Surface and Thin Film Phenomena
ResumoLow energy electron microscopy (LEEM) has developed into one of the premier techniques for in situ studies of surface dynamical processes, such as epitaxial growth, phase transitions, chemisorption and strain relaxation phenomena. Over the last three years we have designed and constructed a new LEEM instrument, aimed at improved resolution, improved diffraction capabilities and greater ease of operation compared to present instruments.
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