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Optical Absorption of Tellurium Suboxide Thin Films

1993; Wiley; Volume: 136; Issue: 2 Linguagem: Inglês

10.1002/pssa.2211360236

1521-396X

Massimo Di Giulio, G. Micocci, R. Rella, Pietro Siciliano, A. Tepore,

Phase-change materials and chalcogenides

physica status solidi (a)Volume 136, Issue 2 p. K101-K104 Short Note Optical Absorption of Tellurium Suboxide Thin Films M. Di Giulio, M. Di Giulio Dipartimento Scienza dei Materiali, Universita' di LecceSearch for more papers by this authorG. Micocci, G. Micocci Dipartimento Scienza dei Materiali, Universita' di LecceSearch for more papers by this authorR. Rella, R. Rella Istituto Materiali per l'Elettronica I.M.E. — C.N.R., Lecce Search for more papers by this authorP. Siciliano, P. Siciliano Istituto Materiali per l'Elettronica I.M.E. — C.N.R., Lecce Search for more papers by this authorA. Tepore, A. Tepore Dipartimento Scienza dei Materiali, Universita' di LecceSearch for more papers by this author M. Di Giulio, M. Di Giulio Dipartimento Scienza dei Materiali, Universita' di LecceSearch for more papers by this authorG. Micocci, G. Micocci Dipartimento Scienza dei Materiali, Universita' di LecceSearch for more papers by this authorR. Rella, R. Rella Istituto Materiali per l'Elettronica I.M.E. — C.N.R., Lecce Search for more papers by this authorP. Siciliano, P. Siciliano Istituto Materiali per l'Elettronica I.M.E. — C.N.R., Lecce Search for more papers by this authorA. Tepore, A. Tepore Dipartimento Scienza dei Materiali, Universita' di LecceSearch for more papers by this author First published: 16 April 1993 https://doi.org/10.1002/pssa.2211360236Citations: 83 Via Arnesano, I-73100 Lecce, Italy. AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onEmailFacebookTwitterLinkedInRedditWechat References 1 W. Y. Lee, J. Vacuum Sci. Technol. A 3, 640 (1985). 10.1116/1.572969 CASWeb of Science®Google Scholar 2 T. Ohta, M. Takenaga, N. Akahira, and T. Yamashita, J. appl. Phys. 53, 8497 (1982). 10.1063/1.330483 CASWeb of Science®Google Scholar 3 M. Takenaga, N. Yamada, K. Nishiuchi, N. Akahira, T. Ohta, S. Nakamura, and T. Yamashita, J. appl. Phys. 54, 5376 (1983). 10.1063/1.332716 CASWeb of Science®Google Scholar 4 M. Takenaga, N. Yamada, S. Ohara, K. Nischiuchi, M. Nagashima, T. Kashihara, S. Nakamura, and T. Yamashita, Proc. SPIE 420, 173 (1983). 10.1117/12.936065 CASWeb of Science®Google Scholar 5 M. Digiulio, G. Micocci, R. Rella, and A. Tepore, J. Vacuum Sci. Technol. A 6, 243 (1988). 10.1116/1.575435 CASWeb of Science®Google Scholar 6 M. Digiulio, R. Rella, P. Siciliano, and S. Cucurachi, Vacuum 43, 305 (1992). 10.1016/0042-207X(92)90161-O CASWeb of Science®Google Scholar 7 T. S. Moss, Optical Properties of Semiconductors, London 1979. Google Scholar 8 J. I. Pankove, in: Optical Processes in Semiconductors, Prentice-Hall, Englewood Cliffs (N.J.) 1971. Google Scholar 9 C. de Blasi, L. Guercia, C. Manfredotti, and C. Paracelli, Computer Phys. Commun. 36, 339 (1985). 10.1016/0010-4655(85)90022-0 Web of Science®Google Scholar 10 A. Mansingh and S. Kumar, Thin Solid Films 161, 101 (1988). 10.1016/0040-6090(88)90240-4 CASWeb of Science®Google Scholar 11 A. Svane and E. Antonwick, J. Phys. Chem. Solids 48, 171 (1987). 10.1016/0022-3697(87)90081-3 CASWeb of Science®Google Scholar Citing Literature Volume136, Issue216 April 1993Pages K101-K104 ReferencesRelatedInformation