The pn-CCD on-chip electronics
1993; Elsevier BV; Volume: 326; Issue: 1-2 Linguagem: Inglês
10.1016/0168-9002(93)90337-h
ISSN1872-9576
AutoresE. Pinotti, H. Bräuninger, N. Findeis, H. Gorke, D. Hauff, P. Holl, J. Kemmer, P. Lechner, G. Lutz, Walter Kink, Norbert Meidinger, G. Metzner, P. Predehl, C. Reppin, L. Strüder, J. Trümper, C. von Zanthier, E. Kendziorra, R. Staubert, V. Radeka, P. Řehák, G. Bertuccio, E. Gatti, A. Longoni, A. Pullia, M. Sampietro,
Tópico(s)Calibration and Measurement Techniques
ResumoA new pn-CCD with an activa area of 3 × 1 cm2 was recently fabricated for ESA's X-ray Multi Mirror Mission (XMM). The front-end electronics has been integrated on the same chip as the detector, and its noise behaviour was investigated. X-rays from a 55Fe source have been used for the absolute calibration. The measured electronic Equivalent Noise Charge (ENC) of the on-chip amplifier was 8.8 e− at room temperature and 2.2 e− at the CCD operating temperature of 150 K. The improvements with respect to the last version with noise figures of 4.8 e− (at 150 K) are due to the reduction of the total input capacitance by a factor of 1.6, the improvement of the transistor transconductance by a factor of 2, and the reduction of 1ƒ noise because of the different p-well implant with a better thermal annealing.
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