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MICROWAVE DIELECTRIC PROPERTIES AND RAMAN SPECTROSCOPY OF SCHEELITE SOLID SOLUTION [ (Li 0.5 Bi 0.5 ) 1-x Ca x ] MoO 4 CERAMICS WITH ULTRA-LOW SINTERING TEMPERATURES

2010; World Scientific; Volume: 03; Issue: 04 Linguagem: Inglês

10.1142/s1793604710001354

1793-6047

Di Zhou, Hong Wang, Qiu-Ping Wang, Xin‐Guang Wu, Jing Guo, Gao-Qun Zhang, Shuiqing Li, Xi Yao, Clive A. Randall, Li‐Xia Pang, HAN-CHEN LIU,

Multiferroics and related materials

A Scheelite solid solution was formed based on [( Li 0.5 Bi 0.5 ) 1-x Ca x ] MoO 4 ceramics and prepared via a solid state reaction method in the range 0.0 ≤ x ≤ 1.0. High performance microwave dielectric properties were obtained in the [(Li 0.5 Bi 0.5 ) 0.15 Ca 0.85 ]MoO 4 ceramic sintered at 760°C with a relative permittivity of 14.1, a Qf value of 24,000 GHz (at 10.0 GHz), and a temperature coefficient value of +10.7 ppm/°C and the [(Li 0.5 Bi 0.5 ) 0.1 Ca 0.9 ]MoO 4 ceramic sintered at 850°C with a relative permittivity of 12.7, a Qf value of 41,300 GHz (at 10.3 GHz), and a temperature coefficient value of -16.5 ppm/°C. X-ray diffraction, Raman spectroscopy and the classical damped oscillator model were applied to study the relationship between the microwave dielectric properties and structures.