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Semi-automated selection of cryo-EM particles in RELION-1.3

2014; Elsevier BV; Volume: 189; Issue: 2 Linguagem: Inglês

10.1016/j.jsb.2014.11.010

1095-8657

Sjors H. W. Scheres,

Electron and X-Ray Spectroscopy Techniques

The selection of particles suitable for high-resolution cryo-EM structure determination from noisy micrographs may represent a tedious and time-consuming step. Here, a semi-automated particle selection procedure is presented that has been implemented within the open-source software RELION. At the heart of the procedure lies a fully CTF-corrected template-based picking algorithm, which is supplemented by a fast sorting algorithm and reference-free 2D class averaging to remove false positives. With only limited user-interaction, the proposed procedure yields results that are comparable to manual particle selection. Together with an improved graphical user interface, these developments further contribute to turning RELION from a stand-alone refinement program into a convenient image processing pipeline for the entire single-particle approach.