Crack formation in epitaxial [110] thin films of YBa2Cu3O7−δ and PrBa2Cu3O7− x on [110]SrTiO3 substrates
1991; American Institute of Physics; Volume: 58; Issue: 15 Linguagem: Inglês
10.1063/1.105110
ISSN1520-8842
AutoresEva Olsson, A. Gupta, M.D. Thouless, A. Segmüller, David R. Clarke,
Tópico(s)Acoustic Wave Resonator Technologies
ResumoA characteristic feature of epitaxial [110] thin films of YBa2Cu3O7−δ and PrBa2Cu3O7−x on [110]SrTiO3 substrates is that the films have a tendency to crack along the (001) planes. We have studied the crack spacing as a function of deposition temperature and film thickness. The experimental data have been found to be in excellent agreement with a theoretical analysis of the crack spacings in brittle films. The study has allowed us to determine the critical thickness below which no cracks are expected to form as a function of temperature for [110] films of YBa2Cu3O7−δ, PrBa2Cu3O7−x, and YBa2Cu3O7−δ/ PrBa2Cu3O7−x bilayers.
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