Uncertainties in theoretical thick target PIXE yields
1981; Elsevier BV; Volume: 191; Issue: 1-3 Linguagem: Inglês
10.1016/0029-554x(81)91063-6
ISSN1872-9606
Autores Tópico(s)Nuclear Physics and Applications
ResumoThe proton induced X-ray yield for an element in a given matrix depends on many processes. These include the ionization cross section, the stopping power and X-ray attenuation effects in the matrix and the efficiency of detection. Uncertainties in their values will be reflected in uncertainties in the X-ray yield. Currently accepted best values for some of these variables are discussed and theoretical thick target yields are compared with experiment for various targets.
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