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Critical Behavior of the Electrical Resistance and Its Noise in Inverted Random-Void Systems

1988; American Physical Society; Volume: 60; Issue: 19 Linguagem: Inglês

10.1103/physrevlett.60.1887

1092-0145

I. Balberg, Norman J. Wagner, Donald W. Hearn, J. A. Ventura,

NMR spectroscopy and applications

A computer simulation of a representative continuum system, the inverted random-void model in three and six dimensions, is reported. It is the first such simulation where the local geometry of the conducting particles is taken into account. The results show that the critical behaviors of both the electrical resistivity and the resistance noise, near the percolation threshold, are well described by the recently suggested models of links in the nodes-links-blobs picture.