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Near-field scanning optical microscopy of photonic crystal nanocavities

2003; American Institute of Physics; Volume: 82; Issue: 11 Linguagem: Inglês

10.1063/1.1559646

1520-8842

Koichi Okamoto, Marko Lončar, Tomoyuki Yoshie, Axel Scherer, Yueming Qiu, P. Gogna,

Near-Field Optical Microscopy

Near-field scanning optical microscopy was used to observe high-resolution images of confined modes and photonic bands of planar photonic crystal (PPC) nanocavities fabricated in active InGaAsP material. We have observed the smallest optical cavity modes, which are intentionally produced by fractional edge dislocation high-Q cavity designs. The size of the detected mode was roughly four by three lattice spacings. We have also observed extended dielectric-band modes of the bulk PPC surrounding the nanocavity by geometrically altering the bands in emission range and eliminating localized modes out of the emission range.