Structural and electrical characterization of magnetoresistive La0.7Ca0.3MnO3 thin films
2003; Elsevier BV; Volume: 262; Issue: 1 Linguagem: Inglês
10.1016/s0304-8853(03)00039-8
ISSN1873-4766
AutoresAlfredo De Santis, F. Bobba, G. Cristiani, A. M. Cucolo, K. Fröhlich, H.‐U. Habermeier, M. Salvato, A. Vecchione,
Tópico(s)Multiferroics and related materials
ResumoWe have investigated the structural and electrical properties of La0.7Ca0.3MnO3 thin films grown both by pulsed laser or DC-sputtering deposition techniques on SrTiO3 (1 0 0) substrates. X-ray diffractograms and pole figures revealed the epitaxial character of the samples. Resistance vs. temperature measurements without applied magnetic field showed the metal–insulator transition temperature (TMI) in the range of 220–260 K. The magnetoresistance temperature dependence was also investigated and correlated with the thickness of the films, the oxygen annealing treatment and the presence of lattice defects.
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