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The Meaning of Size Obtained from Broadened X‐ray Diffraction Peaks

2003; Wiley; Volume: 5; Issue: 5 Linguagem: Inglês

10.1002/adem.200310086

1527-2648

T. Ungár,

Advanced materials and composites

Abstract X‐ray diffraction peak profile analysis (DPPA) is a powerful tool for the characterisation of microstructures either in the bulk or in loose powder materials. The evaluation and modelling procedures have been developed together with the experimental techniques. The dislocation density and structure, as obtained from peak profile analysis, is in good correlation with TEM observations. As for the crystallite size, in some cases a good correlation, however, in other cases definite discrepancies with TEM results can be observed. In the present work those literature data are critically reviewed where crystallite size or grain size have been determined by DPPA and TEM simultaneously. The correlation and discrepancies between DPPA and TEM results are discussed in terms of the microstructures in different types of specimens.