Portal de Periódicos da CAPES

The Measurement of X-Ray Emission Wave-Lengths by Means of the Ruled Grating

1932; American Institute of Physics; Volume: 42; Issue: 6 Linguagem: Inglês

10.1103/physrev.42.743

1536-6065

Rachel Witmer, J. M. Cork,

Calibration and Measurement Techniques

With a plane ruled grating, measurements have been made of the emission wave-lengths in the $L$ series for the elements Va (23) to Zn (30) and in the $K$ series for the elements C (6) to Si (14). With the exception of the $K\ensuremath{\alpha}$ lines of carbon, fluorine and oxygen, the method of the ruled grating yields a longer wave-length in every case than that found for the corresponding lines by the crystal method. The Moseley diagrams representing the observed results are found to be smooth curves. The possible variation of apparent wave-length with a variation in the grazing angle of incidence has been investigated. For angles such that the diffracted lines were not too diffuse, the computed wave-lengths were independent of the incident angle.