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Local Current Mapping and Patterning of Reduced Graphene Oxide

2010; American Chemical Society; Volume: 132; Issue: 40 Linguagem: Inglês

10.1021/ja104567f

1943-2984

Jeffrey M. Mativetsky, Emanuele Treossi, Emanuele Orgiu, Manuela Melucci, G.P. Veronese, Paolo Samorı́, Vincenzo Palermo,

Quantum and electron transport phenomena

Conductive atomic force microscopy (C-AFM) has been used to correlate the detailed structural and electrical characteristics of graphene derived from graphene oxide. Uniform large currents were measured over areas exceeding tens of micrometers in few-layer films, supporting the use of graphene as a transparent electrode material. Moreover, defects such as electrical discontinuities were easily detected. Multilayer films were found to have a higher conductivity per layer than single layers. It is also shown that a local AFM-tip-induced electrochemical reduction process can be used to pattern conductive pathways on otherwise-insulating graphene oxide. Transistors with micrometer-scale tip-reduced graphene channels that featured ambipolar transport and an 8 order of magnitude increase in current density upon reduction were successfully fabricated.